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Research Journal of Engineering and Technology
ISSN: 2321-581X(Online), 0976-2973(Print)
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A Comprehensive Survey for 3D Watermarking
Sakshi Shrivastava1 and Siddhartha Choubey2*
14th Sem M.E (CTA), Shree Shankaracharya College of Engineering and Technology, Bhilai (CG).
2Asst. Prof (CSE), Shree Shankaracharya College of Engineering and Technology, Bhilai (CG).
This paper gives a comprehensive survey on 3D mesh watermarking, which is considered an effective solution to the two emerging problems. Our survey covers an introduction to the relevant state of the art, many researchers, from both the academic and the industrial sectors, have become aware of their intellectual property protection and authentication problems arising with their increasing use. In this paper we specially discuss the advantages and disadvantages of the transformed domain methods and the spatial domain methods.
Watermarking, Compression, Parameterization, Eigen values, Eigen Vector, Laplace Matrix, Ortho Normalization.
Sakshi Shrivastava, Siddhartha Choubey. A Comprehensive Survey for 3D Watermarking. Research J. Engineering and Tech. 2(1): Jan.-Mar. 2011 page 42-47.
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