Author(s): Santosh Kumar Tiwari, Anurag Shrivastava

Email(s): santosh.kt82@gmail.com

DOI: Not Available

Address: Santosh Kumar Tiwari* and Anurag Shrivastava
Department of Electronics and Telecommunication, Shree Sankaracharya College of Engineering and Technology, Bhilai, (C.G), 490020
*Corresponding Author

Published In:   Volume - 2,      Issue - 2,     Year - 2011


ABSTRACT:
In this paper, a wavelet-based multiscale linear minimum mean square-error estimation (LMMSE) scheme for image denoising is proposed, and the determination of the optimal wavelet basis with respect to the proposed scheme is also discussed. The overcomplete wavelet expansion (OWE), which is more effective than the orthogonal wavelet transform (OWT) in noise reduction, is used. Using overcomplete wavelet expansion (OWE), we group the wavelet coefficients with the same spatial orientation at adjacent scales as a vector. and apply LMMSE to the vector. Compared with the LMMSE within each scale, the interscale model exploits the dependency information distributed at adjacent scales. The performance of the proposed scheme is dependent on the selection of the wavelet bases. Two criteria, the signal information extraction criterion and the distribution error criterion, are proposed to measure the denoising performance. The optimal wavelet that achieves the best tradeoff between the two criteria can be determined from a library of wavelet bases. To estimate the wavelet coefficient statistics precisely and adaptively, we classify the wavelet coefficients into different clusters by context modeling, which exploits the wavelet intrascale dependency and yields a local discrimination of images. Experiments show that the proposed scheme outperforms some existing denoising methods.


Cite this article:
Santosh Kumar Tiwari, Anurag Shrivastava. Multiscale Image Denosing With Optimal Wavelet Selection. Research J. Engineering and Tech. 2(2): April-June 2011 page 87-90.


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Research Journal of Engineering and Technology (RJET) is an international, peer-reviewed, research journal aiming at promoting and publishing original high quality research in all disciplines of engineering sciences and technology....... Read more >>>

RNI: Not Available                     
DOI: 10.5958/2321-581X 


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