Author(s): Parul Dawar, Asok De


DOI: Not Available

Address: Parul Dawar1, Asok De2
1Department of ECE, Guru Tegh Bahadur Institute of Technology, GGSIPU, Delhi India
2Director, NIT Patna, Bihar, India
*Corresponding Author

Published In:   Volume - 5,      Issue - 4,     Year - 2014

This paper adumbrates novel metamaterials (MTMs) named ‘C’ shaped Pair (CSP) and Closed Ring Pair (CRP). Ansoft HFSS has been used to design and analyse the CSP MTM having FR4_epoxy (er=4.4) as substrate material and CRP MTM having Mylar (er=2.89) as substrate material. Electric and Magnetic properties of MTMs have been used to mathematically demonstrate the negative permeability and permittivity region. Nicolson Ross Wier (NRW) method has been used to retrieve the material parameters from transmission and reflection coefficient. Nearly 5% deviation has been obtained between the results from Finite Element Method (FEM) based Ansoft HFSS and transmission line theory based quasi-static regime.

Cite this article:
Parul Dawar, Asok De. Comparison between FEM and transmission line based analysis of Novel metamaterials at high frequency. Research J. Engineering and Tech. 5(4): Oct.-Dec., 2014 page 184-189.

Recomonded Articles:

Author(s): M. Venu Gopala Rao, M. Babita Jain

DOI:         Access: Open Access Read More

Author(s): K. Karthika, T. Jaspar Vinitha Sundari, S. David

DOI: 10.5958/2321-581X.2017.00043.5         Access: Open Access Read More

Author(s): Jyoti Prakash, Sanjay Kumar Gupta

DOI:         Access: Open Access Read More

Author(s): Rajesh Shirvastava, Neetesh Nema

DOI:         Access: Open Access Read More

Author(s): Jyoti Prakash, Renu Bala, Kultaran Kumari

DOI: 10.5958/2321-581X.2015.00008.2         Access: Open Access Read More

Research Journal of Engineering and Technology (RJET) is an international, peer-reviewed, research journal aiming at promoting and publishing original high quality research in all disciplines of engineering sciences and technology....... Read more >>>

RNI: Not Available                     
DOI: 10.5958/2321-581X 

Recent Articles